19.06.18, 14:00 Uhr: Kolloquium - Dr. Linus Pithan:
'Enabling tailored molecular thin film growth through in-situ x-ray diffraction'


Am Dienstag, den 19.06.18, um 14:00 Uhr
spricht in einem außerordentlichen Kolloquium

Dr. Linus Pithan

ESRF - The European Synchrotron
Experiments Division, ID03 Beamline, Grenoble

zum Thema:

"Enabling tailored molecular thin film growth through in-situ x-ray diffraction"

Applied physical research on soft matter thin films based on small organic molecules has been a vital field in the past decade. Nowadays a significant share of research on organic thin film structures is attributed to new deposition techniques and the quest for additional growth control parameters in order to follow surface-by-design approaches. Besides the choice of the molecular specials employed in the organic thin film its functionality crucially depends on the structural properties which are in turn a result of the employed growth process.
In this talk a novel strategy to fabricate organic thin films with tailored structural properties is presented. More specifically, the impact of dynamic temperature oscillations on structural thin film properties is analysed in depth. These temperature oscillations are employed on the time scales of molecular monolayer growth. X-ray growth oscillation (at the anti-Bragg point) are used to trigger rapid thermal cooling cycles during the nucleation phase of each individual monolayer while growing the organic semiconducting molecule PTCDI-C8. Using in-situ grazing incidence small angle x-ray scattering (GISAXS) the enhanced layer-by-layer growth of the thin film is analyzed in real time. Following the concept of two motilities the island density is strongly increased during nucleation diffusive processes are selectively enhanced at later stages of mono-layer growth. Based on analytical growth models and phase field simulations the interplay between inter-layer transport and the size of molecular islands is analysed to shine light on kinetic processes during growth defining the surface morphology.

Gäste sind herzlich willkommen.



Leibniz-Institut für Kristallzüchtung

Raum 316, Geb. 19.31,

Max-Born-Str. 2

12489 Berlin-Adlershof


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