Working Group Electron Microscopy - Methods

Transmission Electron Microscopy TEM/STEM (FEI Titan 80-300)

  • Aberration-corrected high-resolution TEM
  • Quantitative Z-contrast
  • Analysis of compositional fluctuations
  • Conventional TEM (diffraction contrast)
  • In-situ  TEM (Protochips Atmosphere)

 

Scanning Electron Microscopy combined with focused Ion Beam (FEI Nova 600)

  • Energy dispersive x-ray spectroscopy
  • Wavelength-dispersive x-ray spectroscopy
  • Electron backscatter diffraction (EBSD)

 

Scanning Electron Microscopy (Zeiss DSM 912)

  • Cathodoluminescence (Gatan MonoCL3)
  • Cooling stage (He)
  • CCD
  • Photomultiplier UV (190nm-800nm)
  • photomultiplier UV-IR (300nm-1800nm)
  • Thermoluminescence

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