Joint Labs & Support Labs


German-Chinese Joint Lab (Dielectrics)

The German-Chinese Joint Lab between the School of Electronic Science and Engineering at Xi´an Jiaotong University and the Leibniz-Institut für Kristallzüchtung (IKZ) and was founded on the occasion of the international Workshop ´Oxide & Graphene` which took place from 14th to 15th January 2020. Our mission is to join forces on the long-term perspective of research and education in the area of dielectrics and 2D materials, covering fundamental as well as device physics.


Dielectric oxide layers and 2D materials with their plethora of functional properties are in the focus of worldwide research to understand their physical properties on the atomic – scale and to engineer their functional characteristics for future device applications. However, the complexity of these materials systems in terms of synthesis, thin film deposition, characterization as well as device processing and integration steps often exceeds the capacities available at individual laboratories. Hence, IKZ and Jiaotong University in Xi´an decided to establish a joint lab and benefit from synergies in complementary research activities and student education. Online lectures, exchange of PhD students and international workshops will be undertaken to promote the common goals. Currently, research focuses on the development of lead-free ferro-/piezoelectric layers for green technology in application areas like sensing & energy harvesting e.g. for the future Internet of Things (IoT). Furthermore, the fundamental physics and processing steps of 2D materials are investigated with the perspective to engineer future functional 3D crystals through advanced layer-by-layer transfer processes.

Xi'an Jiaotong-Universität:
Head: Prof. Gang Niu
Prof. Gang Niu´s webpage:
International School on Dielectics: 

Head: Dr. Jutta Schwarzkopf
Section: Nano Structures & Layers / Thin Oxide Films
Dr. Jens Martin
Section: Nano Structures & Layers / Thin Oxide Films / Topic: „2D goes 3D” by Layer Transfer

Contact IKZ

Dr. Jutta Schwarzkopf

Ph. +49 30 6392 3053


Contact Xi´an Jiaotong University

Prof. Gang Niu

Ph. +86 29 8266 5670 8024


Joint Lab for Electron Microscopy Adlershof (JEMA)

The joint lab for electron microscopy is a facility operated by the Leibniz-Institut für Kristallzüchtung and Humboldt-Universität zu Berlin which shares the excellent equipment of both institutions, to develop the most modern methods in electron microscopy and make them available for both institutions and their partners to study structure property relations in crystalline materials. 


Electron microscopy is the most versatile technique to obtain correlated information on structural and physical properties of solids with high spatial resolution. Transmission electron microscopy and scanning transmission electron microscopy made tremendous methodological advances in the last years. Due to the possibility to realize abberation corrected lenses true atomic resolution can be obtained with a resolution to 0.05 nm and a precision in the pm range. Analytical methods now allow for atomic resolution chemical mapping and electron loss spectroscopy achieves energy resolution that competes with that achievable in synchrotrons. The development of fast cameras with single electron sensitivity and sample holders that allow to follow processes in situ under biasing, at high temperature and under ambient pressure.

JEMA joins latest equipment in structural and analytical electron microscopy. While IKZ provides an aberration corrected (S)TEM (FEI Titan 80-300) equipped with a fast CETA2 camera (up to 400 frames per second) and latest in-situ holders that allow for operation under biasing and heating (Protochips Fusion) and at various gas atmosphere up to atmospheric pressure and temperatures up to 1000°C, Humboldt-Universität provides its (S)TEM with energy dispersive spectroscopy and energy loss spectroscopy.

The Leibniz-Institut für Kristallzüchtung in addition to transmission electron microscopes provides two scanning electron microscopes among them a fully analytical Dual Beam microscope (FEI Nova 600) that allows for structuring samples by an ion beam, and preparing electron transparent lamella from selected areas of a sample and lifting them out for further analysis in the TEM. This microscope provides in addition energy dispersive and wavelength spectroscopy and electron backscatter diffraction. A second, latest generation SEM Thermo Fisher Apreo S with three in-lens detectors and a STEM detector is equipped with a He cooling stage and a Gatan Monarc CL system to study optical properties of semiconductors.

JEMA has been the first joint activity in the field of electron microscopy in Adlershof. A similar centre exists now between Helmholtz Zentrum Berlin und HU Berlin in the field of cryomicroscopy. Other joint labs are on the way, all of them offering complementary equipment, thus making the Campus Adlershof a true centre for electron microscopy in Berlin. 

Head of Section

Dr. Martin Albrecht

Ph. +49 30 6392 3094


IKZ-DESY Joint Lab

The IKZ-DESY Joint Lab between the Leibniz-Institut für Kristallzüchtung (IKZ) and the German Electron-Synchrotron (DESY) bundles and coordinates the activities of IKZ on the Science Campus Hamburg Bahrenfeld. Located in the Center for X-Ray Nanoscience (CXNS), it is an integral part of the cooperation between the two institutions. The Joint Lab supports the IKZ in-house research by offering access to advanced Synchrotron methods. In addition, crystalline materials from IKZ and advanced methods for research at synchrotrons are being developed to improve the performance of existing and future lightsources. As a third pillar the Joint Lab together with DESY Innovation Office aims to forward the transfer of original research toward the market, e.g., via foundation of StartUps.


The IKZ research group X-Ray Optics and DESY Nanolab operate a joint laserlab for time-resolved ultrafast spectroscopy at the IKZ-DESY Joint Lab. The setup is open for experimental characterization of IKZ materials and methods using various optical techniques. IN addition, the lab is used for preparation experiments for synchrotron beamtimes.

Contact IKZ

Dr. Peter Gaal

Ph. +49 30 6392 2858


Contact DESY NanoLab

Prof. Dr. Andreas Stierle

Ph. +49 40 8998 2005


IKZ-Cornell Joint Lab for Unleashing Hidden Properties to Empower Oxide Electronics

The German-American Joint Lab between Cornell University and the Leibniz-Institut für Kristallzüchtung (IKZ) was launched with the 2020 appointment of Prof. Darrell G. Schlom as a Leibniz Chair at IKZ following two decades of fruitful collaboration with him and his group.  Our joint mission is the coordinated research on the development of large-area single-crystal oxide substrates enabling the discovery of materials with unprecedented properties for the next generation of oxide electronic devices.


The goal of this collaboration is to achieve thin films of complex oxides with drastically improved electronic properties or that exhibit spectacular phenomena. Our approach is to target systems for study where appropriate substrates are needed to enhance properties or unleash novel phenomena in the overlying complex oxide film. The electronic properties and phenomena of interest include superconductivity, ferroelectricity, ferromagnetism, antiferromagnetism, piezoelectricity, pyroelectricity, multiferroicity, metal-insulator transitions, catalysis, electrical mobility, high spin polarization, thermoelectricity, non-linear optical, magnetoelectric, magneto-optic, and magnetothermal effects. Complex oxides are record holders for many of these behaviors. In many cases thin films with properties comparable to a desired complex oxide in bulk form have not been achieved because of the lack of an appropriate substrate, for example, when there are no commercial isostructural substrates with good lattice match.

This is the case for many perovskites, pyrochlores, magnetoplumbites and many other complex oxides, where there are no commercial substrates whatsoever with these structures. Our collaboration includes both types of substrate needs: more ideal substrates for the stable polymorph of complex oxides with stellar properties that have not been achieved in thin film form and substrates enabling the growth of metastable polymorphs of oxides. The latter approach was verified by a joint experiment published by Haeni et al. (2004) that ignited a fury of research in the strain-engineering of complex oxides.

Leibniz-Institut für Kristallzüchtung (IKZ):
Coordination: Dr. Christo Guguschev
Section: Oxides & Fluorides / Substrate Crystals for Advanced Functional Oxides


Cornell University:
Coordination: Prof. Darrell G. Schlom
Herbert Fisk Johnson Professor of Industrial Chemistry in the Department of Materials Science & Leibniz Chair at IKZ
Cornell Webpage:
Leibniz Chair:

J. H. Haeni, P. Irvin, W. Chang, R. Uecker, P. Reiche, Y. L. Li, S. Choudhury, W. Tian, M. E. Hawley, B. Craigo, A. K. Tagantsev, X. Q. Pan, S. K. Streiffer, L. Q. Chen, S. W. Kirchoefer, J. Levy & D. G. Schlom
Room-temperature ferroelectricity in strained SrTiO3


K.J. Choi, M.D. Biegalski, Y.L. Li, A. Sharan, J. Schubert, R. Uecker, P. Reiche, Y.B. Chen, X.Q. Pan, V. Gopalan, L.-Q. Chen, D.G. Schlom, and C.B. Eom
Enhancement of Ferroelectricity in Strained BaTiO3 Thin Films


J.H. Lee, L. Fang, E. Vlahos, X. Ke, Y.W. Jung, L.F. Kourkoutis, J-W. Kim, P.J. Ryan, T. Heeg, M. Roeckerath, V. Goian, M. Bernhagen, R. Uecker, P.C. Hammel, K.M. Rabe, S. Kamba, J. Schubert, J.W. Freeland, D.A. Muller, C.J. Fennie, P. Schiffer, V. Gopalan, E. Johnston-Halperin, and D.G. Schlom
A Strong Ferroelectric Ferromagnet Created by means of Spin-Lattice Coupling


D. G. Schlom, L. Chen, C. J. Fennie, V. Gopalan, D. A. Muller, X. Pan, R. Ramesh and R. Uecker
Elastic strain engineering of ferroic oxides


N.M. Dawley, E.J. Marksz, A.M. Hagerstrom, G.H. Olsen, M.E. Holtz, V. Goian, C. Kadlec, J. Zhang, X. Lu, J.A. Drisko, R. Uecker, S. Ganschow, C.J. Long, J.C. Booth, S. Kamba, C.J. Fennie, D.A. Muller, N.D. Orloff, and D.G. Schlom
Targeted Chemical Pressure Yields Tunable Millimetre-Wave Dielectric
Nature Materials


C. Guguschev, D. Klimm, M. Brützam, T.M. Gesing, M. Gogolin, H. Paik, A. Dittmar, V.J. Fratello, D.G. Schlom
Single crystal growth and characterization of Ba2ScNbO6 – A novel substrate for BaSnO3 films

A patent application is ongoing (US reference number: 16/424,987)

Contact IKZ

Dr. Christo Guguschev

Ph. +49 30 6392 3124


Contact Cornell University

Prof. Darrell G. Schlom

Ph. +1 607 255 6504


Support Lab: ERDF (European Regional Development Fund) Application Laboratory "Materials for Oxide Electronics”

Since March 2017, the ERDF Application Laboratory has been pursuing the goal of developing oxide functional layers with high structural perfection for application-relevant device test structures like for example semiconducting gallium-oxide layers (Ga2O3) for vertical power devices,  resistively switchable strontium-titanate layers (SrTiO3) for ReRAMs and piezoelectric potassium-sodium-niobate layers ((K,Na)NbO3) for acoustic surface wave sensors.


This includes the deposition and characterization of single-crystalline, oxide layers with low defect density and defined electrical and structural properties tuned by doping and lattice strain. In order to achieve a high structural perfection of the layers, the section "Thin Oxide Films" uses the method of metal-organic vapor phase epitaxy (MOVPE), which is already the deposition method of choice in industry due to its scaling potential. In the application laboratory we are looking for synergies especially with regional academic and industrial partners.


Dr. Jutta Schwarzkopf

Ph. +49 30 6392 3053


Support Lab: Chemical Metrology

An important prerequisite for the reliable evaluation of test results in crystal growth is the regular measurement of the chemical compositions of impurity concentrations in starting materials and crystals.


At the IKZ, measurements are performed in particular with "Inductively Coupled Plasma Optical Emission Spectroscopy" (ICP-OES) and x-ray fluorescence analysis (XRF). Prior to the actual ICP-OES measurement, the materials to be measured must first be digested using a suitable method, which must be developed specifically for each material and impurity. Usually this involves grinding and microwave digestion in acidic or basic solution. XRF measurements are mainly used for the planar visualization of composition and impurities with a resolution of 25 µm. The core competence of IKZ is the measurement of oxidic (e.g. Ga2O3, REScO3) and fluoridic (CaF, KTF) materials.

On request, the IKZ also offers measurement services for external customers for the materials mentioned above.


Dr. Thomas Straubinger

Ph. +49 30 6392 3123


Support Lab: Crystal Machining

At the IKZ, crystals (Si, Ge, GaAs, InP, oxides, fluorides, AlN) with very different, in particular mechanical, properties are produced and have to be processed into tailor-made samples as preparation for different characterization methods.


For structural and optical characterization, wafers or longitudinal sections with polished surfaces are typically produced and then etched or irradiated. For the production of the required surface quality, several laboratory polishing machines are available on which polishing can be carried out with different polishing agents using purely mechanical but also chemical-mechanical processes. For laser applications, 3D samples are also required for which exact angles of the sample surfaces to each other must be realized. In addition to precise sawing and polishing machines, x-ray and laser measuring devices are available for this purpose, with which the samples can be precisely aligned before processing.

On request, the IKZ also offers processing services for external customers for the materials mentioned above.


Dr. Thomas Straubinger

Ph. +49 30 6392 3123


Support Lab: Test structure lab

To bridge the gap between crystal characterization and prototype development, we are fabricating test devices from epitaxial thin films and microscopic 2D-crystals for electrical characterization. We employ electron beam lithography and direct laser writing for microscopic patterning, while metal contacts are produced by standard evaporation techniques. The test structure lab is operated in collaboration with Prof. T. Masselink and Prof. S. Fischer, Physics Department, Humboldt University, Berlin.


Thin films are often employed in devices in which large electric fields are present and where local defects can affect device performance drastically. Microscopically small contacts minimize the chances of device failure and provide good statistics. Another application of lithography is the electrical characterization of exfoliated 2D-crystals as they have only microscopic lateral dimensions. Due to the irregular shape of the crystals, contact patterns must be designed individually.

Hao Chen, Pinjia Zhou, Jiawei Liu, Jiabin Qiao, Barbaros Oezyilmaz, Jens Martin
Gate controlled valley polarizer in bilayer graphene
Nature Communications
DOI: 10.1038/s41467-020-15117-y


Dr. Jens Martin

Ph. +49 30 6392 2857