Doping of Czochralski-grown bulk ß- Ga2O3 single crystals with Cr, Ce and AlZ. Galazka, Steffen Ganschow, Andreas Fiedler, Rainer Bertram, Detlef Klimm, Klaus Irmscher, Robert Schewski, Mike Pietsch, Martin Albrecht, Matthias BickermannJournal of Crystal Growth 486 (2018) 82–9003-2018
Thermal conductivity of rare-earth scandates in comparison to other oxidic substrate crystalsJ. Hidde, Christo Guguschev, Steffen Ganschow, Detlef KlimmJournal of Alloys and Compounds 738 (2018) 415e42103-2018
Ultrahigh thermal conductivity of isotopically enriched silicon A. V. Inyushkin, A. N. Taldenkov, J. W. Ager, E. E. Haller, H.Riemann, N. V. Abrosimov, H.-J. Pohl, P. Becker Journal of Applied Physics 123, 095112 (2018)03-2018
On melt solutions for the growth of CaTiO3 crystalsD. Klimm, Max Schmidt, Nora Wolff, Christo Guguschev, Steffen GanschowJournal of Crystal Growth 486 (2018) 117–12103-2018
Zero-field optical magnetic resonance study of phosphorus donors in 28-siliconK. J. Morse, P. Dluhy, J. Huber, J. Z. Salvail, K. Saeedi, H. Riemann, N. V. Abrosimov, P. Becker, H.-J. Pohl, S. Simmons, M. L. W. ThewaltPhysical Review B, 97 (2018) 11520503-2018
Simulation of grain evolution in solidification of silicon on meso-scopic scaleX. Qi, Lijun Liu, Thècle Riberi-Béridot, Nathalie Mangelinck-Noël, Wolfram MillerComputational Materials Science, Volume 159, March 2019, Pages 432-43903-2018
Short lifetime components in the relaxation of boron acceptors in silicon K. Saeedi, N. Stavrias, B. Redlich, H. Riemann, N. V. Abrosimov, P. Becker, H.-J. Pohl, M. L. W. Thewalt, B. N. Murdin Phys. Rev. B 97, 12520503-2018
Growth of Bulk GaN from Gas phaseD. Siche, R. ZwierzCRYSTAL Research & Technology, 53 (2018) 1700224 1-1503-2018
Widely tunable, efficient 2 μm laser inmonocrystalline Tm3+:SrF2A. Scottile, E. Damiano, M. Rabe, R. Bertram, D. Klimm, M. TonelliJournal of Crystal Growth, 483 (2018) 121-12403-2018
Diode-pumped femtosecond Tm3+-doped LuScO3 laser near 2.1 µmN. K. Stevenson, C. T. A. Brown, J. M. Hopkins, M. D. Dawson, C. Kränkel, and A. A. LagatskyOptics Letters, 43 (2018) 1287-129003-2018
Advanced crystal growth techniques for thallium bromide semiconductor radiation detectorsA. Datta, Piotr Becla, Christo Guguschev, Shariar MotakefJournal of Crystal Growth 483 (2018) 211–21502-2018
Divacancy-tin related defects in irradiated germanium L. I. Khirunenko, M. G. Sosnin, A. V. Duvanskii, N. V. Abrosimov, H. Riemann Journal of Applied Physics 123, 161595 (2018)02-2018
Crystal growth and scintillation performance of Cs2HfCl6  and Cs2HfCl4Br2. Journal of Crystal Growth, under review. S. Lam, C. Guguschev, A. Burger, M. Hackett, S. MotakefJournal of Crystal Growth, 483 (2018) 121-12402-2018
Locally grown Cu(In,Ga)Se2 micro islands for concentrator solar cellsM. Schmid, B. Heidmann, F. Ringleb, K. Eylers, O. Ernst, S. Andree, J. Bonse, T. Boeck, J. KrügerOptics Letters, 43 (2018) 4791-479402-2018
Thermodynamic investigations on the growth of CuAlO2 delafossite crystalsN. Wolff, D. Klimm, D. SicheAppl. Phys. Lett, 113 (2018) 05290102-2018
Defect-induced Stress Imaging in Single and Multi-crystalline semiconductor MaterialsM. Herms, Matthias Wagner, Stefan Kayser, Frank M. Kießling, Anna Poklad, Ming Zhaod, Ulrich KretzereMaterials Today: Proceedings 5 (2018) 14748–1475601-2018
Highly-efficient and compact Tm3+:RE2O3 (RE = Y, Lu, Sc) sesquioxide lasers based on thermal guidingP. Loiko, P. Koopmann, X. Mateos, J. M. Serres, V. Jambunathan, M. Aguiló, U. Griebner, V. Petrov, and C. KränkelIEEE Journal of Selected Topcis in Quantum Electronics, 24 (2018) 160071301-2018
Elastically frustrated rehybridization: Origin of chemical order and compositional limits in InGaN quantum wellsL. Lymperakis, T. Schulz, C. Freysoldt,1 M. Anikeeva, Z. Chen, X. Zheng, B. Shen, C. Chèze, M. Siekacz, X. Q. Wang, M. Albrecht, and J. NeugebauerPHYSICAL REVIEW MATERIALS 2, 011601(R) (2018)01-2018
Sol-gel growth and characterization of In2O3 thin filmsS. A. Palomares-Sanchez, Bernard E. Wattsa, Detlef Klimmb, Andrea Baraldic,Antonella Parisinic, Salvatore Vantaggioc, Roberto FornariaThin Solid Films 645 (2018) 383–39001-2018